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Название: ESD Testing: From Components to Systems
Автор: Steven H. Voldman
Издательство: Wiley
Год: 2016
Формат: PDF
Размер: 12,8 Мб
Язык: английский / English
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance.
ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup.
Автор: Steven H. Voldman
Издательство: Wiley
Год: 2016
Формат: PDF
Размер: 12,8 Мб
Язык: английский / English
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance.
ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup.