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Название: Defects in Advanced Electronic Materials and Novel Low Dimensional Structures
Автор: Edited by Jan Stehr, Irina Buyanova, Weimin Chen
Издательство: Woodhead Publishing
Год: 2018
Формат: PDF
Страниц: 309
Для сайта: vtome.ru
Размер: 10,9 MB
Язык: English
Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene.