Автор: Peter W. Hawkes
Название: Advances in Imaging and Electron Physics, Volume 193
Издательство: Elsevier
Год: 2016
ISBN: 9780128048153; 0128048158
Серия: Advances in Imaging and Electron Physics (Book 193)
Язык: English
Формат: pdf
Размер: 13,2 mb
Страниц: 154

The two chapters that fill this volume describe tools for studying the brightness of electron beams and for analysing the properties of mass spectrometers.

First, L.D. Duffy and A.J. Dragt introduce the concept of eigen-emittance. Three kinematic invariants are associated with charged-particle beams, in linear transport mode. These invariants are known as eigen-emittances and a study of their properties makes it possible to tailor the beam to fit the application in question. The theory is based on the notion of sym-plectic beam transport, a subject on which A.J. Dragt has already contributed to these Advances (Advances in Electronics & Electron Physics, 67, 1986, 65—120, with E. Forest). The authors first recapitulate the basic theory before explaining how the emittance can be adapted as required. The remainder of the chapter, which form a short treatise on the subject, presents various applications.

In the second chapter, I. Spivak-Lavrov describes at length ways of analysing the properties of both static and time-of-flight mass spectrometers and of devising new designs. The optics of these instruments is set out in detail, in an attempt to make the article self-contained. Much Russian work is cited, often from journals that are not available in English translation and in some cases, are not widely available outside their countries of origin.