Название: Pipelined Analog to Digital Converter and Fault Diagnosis
Автор: Alok Barua
Издательство: IOP Publishing
Год: 2020
Страниц: 183
Язык: английский
Формат: pdf (true), epub
Размер: 30.8 MB

Pipelined analog to digital converters (ADCs) have become the architecture of choice for high-speed and moderate- to high-resolution devices. Subsequently, different techniques of fault diagnosis by the built-in self-test (BIST) system have been developed.

An ideal reference for graduate students and researchers within electrical, electronics and computer engineering, this book provides a rigorous, theoretical and mathematical analysis for the design of pipelined ADCs, along with detailed practical aspects of implementing it in very large-scale integration (VLSI).

Mixed signal circuits incorporating both analog and digital systems have become increasingly prevalent in chip design. An analog system takes up a small area in a mixed signal circuit, however, its failure rate is rather high compared to the digital system. A systematic approach must be devised to fabricate a fault-free chip. The analog-to-digital converter (ADC) is a link between an analog signal and a digital circuit or system. The fastest ADC is the flash ADC, but it is hardware intensive. For example, a 4 bit flash ADC needs fifteen comparators as well as a priority encoder. The successive approximation ADC is the most popular for signal conditioning since it needs less hardware, although its conversion time is not very impressive. The pipelined ADC is a good compromise between speed and area-on-silicon. It has an in-built flash ADC of smaller dimensions. In today’s world, the cost of testing the chip before it goes to the end user is extremely high. The only solution to this problem is to build a testing circuit on the chip itself so that testing can be performed without using any test equipment. This book has been written to describe the development of a custom-built pipelined ADC and the different techniques for its fault diagnosis using a built-in self-test system.

The book contains five chapters, with each chapter covering a pipelined ADC and a fault diagnosis technique. The diagnosis method is different in each of the chapters.




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